Ethernet Fixture Resistive Load Board

Ethernet Fixture Resistive Load Board

The PMA Transmitter shall comply with the electrical specifications defined in IEEE Std 802.3™-2022, Clause 40.4.2.2 Compliance must be verified under two test conditions:

  1. Clean Signal Condition: The transmitted signal is measured using this Ethernet Fixture Resistive Load Board in a low-noise environment to establish baseline compliance.
  2. Disturbed Signal Condition: The transmitted signal is subjected to an externally introduced disturbance, emulated by a sine wave injection in conjunction with a 1000BASE-T Ethernet Disturber. This simulates realistic interference conditions for stress testing transmitter performance.

Measurements should confirm that the transmitter maintains specification-compliant signaling in both conditions.

Can be used by any brand of oscilloscope with enough bandwidth such as Rohde & Schwarz, Tektronix, Keysight / Agilent, Teledyne Lecroy, Yokogawa, Siglent, Rigol, Micsig, GW Instek, UNI-T, …

 

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Description

Used for 1000Base-T – 2.5G/5G/10GBase-T

1000BaseT

  • Peak differential output voltage (IEEE Std 802.3™‐2022 – 40.6.1.2.1)
  • Maximum Output Droop (IEEE Std 802.3™‐2022 – 40.6.1.2.2)
  • Differential output templates (IEEE Std 802.3™‐2022 – 40.6.1.2.3)
  • Transmitter Distortion (IEEE Std 802.3™‐2022 – 40.6.1.2.4)
  • Jitter Master & Slave Mode (IEEE Std 802.3™‐2022 – 40.6.1.2.5)
  • Clock Frequency (IEEE Std 802.3™‐2022 – 40.6.1.2.6)

Testing shall be done on all 4 Pairs A, B, C and D.
Beside a suitable oscilloscope a suitable differential probe is required for the following measurements.

Pattern Criteria
40.6.1.2.1
Voltage Point A Test Mode 1 670 mV <= x <= 820 mV
Voltage Point B Test Mode 1 670 mV <= x <= 820 mV
Voltage Point A B difference Test Mode 1 x <= 1 %
Voltage difference between Point C and AVG(A,B)/2 Test Mode 1 x <= 2 %
Voltage difference between Point D and AVG(A,B)/2 Test Mode 1 x <= 2 %
40.6.1.2.2
Voltage magnitude at point G versus point F Test Mode 1 x >= 73.1 %
Voltage magnitude at point J versus point H Test Mode 1 x >= 73.1 %
40.6.1.2.3
Differential Output Templates Test Mode 1 Multiple Mask for A, B, C, D, F and H
40.6.1.2.4
Transmitter Distortion – Minimum peak distortion Test Mode 4 x < 10 mV
Percentage of eye opening within limit Test Mode 4 x >= 60 %
40.6.1.2.5
Jitter Master Mode – Unfiltered TIE jitter Test Mode 2 x <= 1.4 ns
Jitter Master Mode – Filtered TIE jitter Test Mode 2 x <= 300 ps
Jitter Master Mode  – Transmitter Clock Frequency Test Mode 2 124.9875 MHz < x < 125.0125 MHz
Jitter Slave Mode – Unfiltered TIE jitter
(without TX_CLK approach)		 Test Mode 2
Test Mode 3		 x <= 1.4 ns
Jitter Slave Mode – Filtered TIE jitter
(without TX_CLK approach)		 Test Mode 2
Test Mode 3		 x <= 400 ps

1000BaseT Test Mode 1

1000BaseT Test Mode 4

2.5GBaseT

  • Maximum output Droop (IEEE Std 802.3™‐2022 – 126.5.3.1)
126.5.3.1 Pattern Criteria
Maximum output Droop Test Mode 6

5GBaseT

  • Maximum output Droop (IEEE Std 802.3™‐2022 – 126.5.3.1)
126.5.3.1 Pattern Criteria
Maximum output Droop Test Mode 6

 

10GBaseT

  • Maximum output Droop (IEEE Std 802.3™‐2022 – 55.5.3.1)
55.5.3.1 Pattern Criteria
Maximum output Droop Test Mode 6

 

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